atomic force microscope (AFM)

атомно-силовий мікроскоп. Тип скануючого зондового мікроскопа з мікроскопічним сенсором сили як зонд. Проводячи сканування силовим сенсором (гнучка консоль з на-конечником) АСМ над поверхнею зразка і записуючи деформацію консолі, можна вимірювати локальну висоту, хімічні і механічні властивості зразка

English-Ukrainian dictionary of microelectronics. 2013.

Смотреть что такое "atomic force microscope (AFM)" в других словарях:

  • Atomic Force Microscope —  Atomic Force Microscope  (AFM)  Атомно силовой микроскоп (АСМ)   Прибор для изучения поверхности твердых тел, основанный на сканировании острием (иглой) кантилевера (зонда) поверхности и одновременном измерении атомно силового взаимодействия… …   Толковый англо-русский словарь по нанотехнологии. - М.

  • Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …   Wikipedia

  • Atomic force microscope — Microscope à force atomique Pour les articles homonymes, voir AFM et Microscope. Le premier microscope à force ato …   Wikipédia en Français

  • atomic force microscope — n an instrument used for mapping the atomic scale topography of a surface by means of the repulsive electronic forces between the surface and the tip of a microscopic probe moving above the surface abbr. AFM …   Medical dictionary

  • atomic force microscopy — n the art or process of using an atomic force microscope abbr. AFM …   Medical dictionary

  • Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …   Wikipedia

  • Magnetic force microscope — MFM images of 3.2 GB and 30 GB computer hard drive surfaces. Magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip scans a magnetic sample; the tip sample magnetic interactions are detected and used …   Wikipedia

  • Conductive atomic force microscopy — (C AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal coated tip of the… …   Wikipedia

  • Kelvin probe force microscope — Kelvin probe force microscopy ( KPFM ), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM) that was [http://dns.ntu PHYS LETT 58 2921 1991.pdf invented] in 1991.… …   Wikipedia

  • Force spectroscopy — is a dynamic analytical technique that allows the study of the mechanical properties of single polymer molecules or proteins, or individual chemical bonds. It is performed by pulling on the system under scrutiny with controlled forces. As a… …   Wikipedia

  • Microscope a force atomique — Microscope à force atomique Pour les articles homonymes, voir AFM et Microscope. Le premier microscope à force ato …   Wikipédia en Français


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